The　performance　degradation　of　electronic　products　is　similar　with　the　tiredness　of　physical　materials.　The　electronic　product　life　has　a　close　relationship　with　the　electric　stress　and　environmental　stress.　According　to　the　mentioned　relationship,　by　an　accelerated　life　test　method,　the　failure　appearance　process　was　accelerated　and　the　BS　model　parameters　were　obtained　in　a　short　period　under　accelerated　stress　to　avoid　the　trouble　of　gaining　the　parameters　caused　by　electronic　products＇　long　life.　The　electronic　product　life　was　predicted　by　BS　model　parameters　under　normal　stress　deduced　from　that　under　accelerated　one　based　on　gray　forecast　theory.　Taking　a　power　supply　circuit　board　of　a　certain　type　radar　for　example,　it　was　verified　that　the　method　is　feasible.