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Abstract：
In this paper, we have studied on the absorbing properties of three different types of SiC absorbers such as ultra-fine SiC, SiC whisker and nanometer SiC. Electromagnetic parameters of the three types of SiC were tested in the frequency range of 2∼18GHz. Both the real and imaginary parts of complex permittivity of nanometer SiC are higher than that of others. The attenuation constant of nanometer SiC is higher than that of ultra-fine SiC and SiC whisker, increasing from 93.7 to 766.5 with increasing frequency. The minimum reflection loss of -5.53 dB was obtained at 9.72 GHz for the nanometer SiC. The nanometer SiC suggests a better capacity of dielectric loss in microwave range than that of ultra-fine SiC and SiC whisker. © (2012) Trans Tech Publications.
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Applied Mechanics and Materials
ISSN： 1660-9336
Year： 2012
Publish Date： 2012
Volume： 117-119
Page： 1057-1060
Language： English
Cited Count：
WoS CC Cited Count： 0
SCOPUS Cited Count： 9
ESI Highly Cited Papers on the List： 0 Unfold All
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30 Days PV： 0
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