• Complex
  • Title
  • Author
  • Keyword
  • Abstract
  • Scholars
Search

Author:

Zhang, Yingyao (Zhang, Yingyao.) | Liu, Zhiyuan (Liu, Zhiyuan.) | Cheng, Shaoyong (Cheng, Shaoyong.) | Yang, Lanjun (Yang, Lanjun.) | Geng, Yingsan (Geng, Yingsan.) | Wang, Jimei (Wang, Jimei.)

Indexed by:

CPCI-S SCIE EI Scopus

Abstract:

We experimentally investigated the influence of contact contour on breakdown characteristics in vacuum under uniform field. Four vacuum interrupters were used and their contact contours were designed to obtain an effective area (S(eff)) from 211 mm(2) to 550 mm(2). The contact parameters were contact diameter 42.8 mm, contact gap 6 mm, contact thickness 16 mm and contact material CuCr50. Basic impulse level (BIL) voltage (1.2x50 mu s) was applied. Experimental results revealed that the effective area S(eff) had a significant influence on the conditioning process. The larger the effective area was, the slower the conditioning process was. When the breakdown voltage saturated, the breakdown probability distribution followed a Weibull distribution. The shape parameter that represented the breakdown voltage scatter was constant, independent of the effective area. The effective area (S(eff)) had no significant influence on the breakdown voltage under a uniform field in vacuum.

Keyword:

breakdown characteristics effective area uniform field Vacuum Weibull distribution

Author Community:

  • [ 1 ] [Zhang, Yingyao; Liu, Zhiyuan; Cheng, Shaoyong; Yang, Lanjun; Geng, Yingsan; Wang, Jimei] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China.

Email:

Show more details

Related Keywords:

Source :

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION

ISSN: 1070-9878

Year: 2009

Publish Date: DEC

Issue: 6

Volume: 16

Page: 1717-1723

Language: English

0 . 8 4 8

JCR@2009

2 . 9 3 1

JCR@2020

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

FAQ| About| Online/Total:779/168616779
Address:XI'AN JIAOTONG UNIVERSITY LIBRARY(No.28, Xianning West Road, Xi'an, Shaanxi Post Code:710049) Contact Us:029-82667865
Copyright:XI'AN JIAOTONG UNIVERSITY LIBRARY Technical Support:Beijing Aegean Software Co., Ltd.