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Author:

Chen, J. Y. (Chen, J. Y..) | Chen, H. L. (Chen, H. L..) (Scholars:陈花玲) | Pan, E. (Pan, E..)

Indexed by:

SCIE EI Scopus

Abstract:

Reflection and transmission coefficients of plane waves with oblique incidence to a multilayered system of piezomagnetic and/or piezoelectric materials are investigated in this paper. The general Christoffel equation is derived from the coupled constitutive and balance equations, which is further employed to solve the elastic displacements and electric and magnetic potentials. Based on these solutions, the reflection and transmission coefficients in the corresponding layered structures are subsequently obtained by virtue of the propagator matrix method. Two layered examples are selected to verify and illustrate our solutions. One is the purely elastic layered system composed of aluminum and organic glass materials. The other layered system is composed of the novel magnetoelectroelastic material and the organic glass. Numerical results are presented to demonstrate the variation of the reflection and transmission coefficients with different incident angles, frequencies, and boundary conditions, which could be useful to nondestructive evaluation of this novel material structure based on wave propagations.

Keyword:

layered structure magnetoelectroelastic material reflection and transmission coefficients wave propagation

Author Community:

  • [ 1 ] [Chen, J. Y.; Chen, H. L.] Xian Jiaotong Univ, Sch Mech Engn, Xian 710049, Peoples R China
  • [ 2 ] [Chen, J. Y.] Zhengzhou Univ, Sch Mech Engn, Zhengzhou 450001, Peoples R China
  • [ 3 ] [Pan, E.] Univ Akron, Dept Civil Engn, Akron, OH 44325 USA

Reprint Author's Address:

  • Xian Jiaotong Univ, Sch Mech Engn, Xian 710049, Peoples R China.

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Source :

JOURNAL OF VIBRATION AND ACOUSTICS-TRANSACTIONS OF THE ASME

ISSN: 1048-9002

Year: 2008

Issue: 3

Volume: 130

0 . 7 2 8

JCR@2008

2 . 3 4 3

JCR@2019

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 25

SCOPUS Cited Count: 19

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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