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Author:

Wang, Guolin (Wang, Guolin.) | Wang, Shuhong (Wang, Shuhong.) | Duan, Nana (Duan, Nana.) | Huangfu, Youpeng (Huangfu, Youpeng.) | Zhang, Haijun (Zhang, Haijun.) | Xu, Weijie (Xu, Weijie.) | Qiu, Jie (Qiu, Jie.)

Indexed by:

CPCI-S SCIE EI Scopus

Abstract:

In this paper, the extended finite-element method (XFEM) is employed to analyze electric field of insulating plate with crack. To begin with, both the approximation of XFEM and features of the enrichment functions for crack tip are presented. Then, XFEM is used to solve electric potential of an insulating plate with a middle crack, which proves the method can save computational time by comparison with classic finite-element method (CFEM) under the same computational accuracy. In addition, XFEM is also applied to calculate electrical field at crack tip of an insulating plate with an edge crack, which reveals that the relative error between XFEM and CFEM is small when the meshing size of CFEM around crack tip is smaller than that of XFEM. Therefore, electric field analysis of discontinuous and singular solutions can demonstrate the superior performance of XFEM.

Keyword:

Crack electric field extended finite-element method (XFEM) insulating materials

Author Community:

  • [ 1 ] [Wang, Guolin; Wang, Shuhong; Duan, Nana; Huangfu, Youpeng; Zhang, Haijun; Xu, Weijie; Qiu, Jie] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 2 ] [Wang, Guolin]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 3 ] [Wang, Shuhong]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 4 ] [Duan, Nana]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 5 ] [Huangfu, Youpeng]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 6 ] [Zhang, Haijun]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 7 ] [Xu, Weijie]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China
  • [ 8 ] [Qiu, Jie]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Sch Elect Engn, Xian 710049, Peoples R China.

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Source :

IEEE TRANSACTIONS ON MAGNETICS

ISSN: 0018-9464

Year: 2015

Publish Date: MAR

Issue: 3

Volume: 51

Language: English

1 . 2 7 7

JCR@2015

1 . 7 0 0

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:157

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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