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Author:

Ren, Ming (Ren, Ming.) | Liu, Jingjing (Liu, Jingjing.) | Sun, Luyi (Sun, Luyi.) | Cao, Yang (Cao, Yang.)

Indexed by:

CPCI-S EI Scopus

Abstract:

Exfoliated montmorillonite (MMT) nanosheets were aligned and self-assembled with poly(vinyl alcohol) (PVA) to form highly ordered laminate nanocoatings on the surface of polymeric thin films to impart excellent barrier properties as well as dielectric enhancement. In this paper, the dielectric properties of polymer thin films with nanoclay coatings were investigated. A remarkable improvement in the breakdown strength of LDPE and Kapton (R) films with the application of nanoclay coating was discovered. In addition, the dielectric spectroscopy study of BOPP and Kapton r films indicated a much improved thermal stability in their permittivity response with the application of the nanoclay coatings. Such improvement in the thermal stability of dielectric response was achieved without obvious increase of the dielectric dissipation factors.

Keyword:

breakdown strength coating dielectric constant Montmorillonite polymer film

Author Community:

  • [ 1 ] [Ren, Ming; Liu, Jingjing; Sun, Luyi; Cao, Yang] Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA
  • [ 2 ] [Ren, Ming] Xi An Jiao Tong Univ, 28 West Xianning Rd, Xian 710049, Shaanxi, Peoples R China
  • [ 3 ] [Ren, Ming]Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA
  • [ 4 ] [Liu, Jingjing]Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA
  • [ 5 ] [Sun, Luyi]Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA
  • [ 6 ] [Cao, Yang]Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA
  • [ 7 ] [Ren, Ming]Xi An Jiao Tong Univ, 28 West Xianning Rd, Xian 710049, Shaanxi, Peoples R China

Reprint Author's Address:

  • Univ Connecticut, 97 North Eagleville Rd, Storrs, CT 06269 USA.

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Source :

2016 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (IEEE CEIDP)

ISSN: 0084-9162

Year: 2016

Page: 651-654

Language: English

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

Affiliated Colleges:

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