This　paper　presents　a　complementary　split　ring　resonator　(CSRR)　based　sensor　for　non-contact　sheet　resistance　characterization　of　conductive　nanometric　films.　Through　fullwave　simulations,　we　observed　the　dependence　of　Q-factor　of　CSRR　on　sheet　resistance　of　conductive　film　which　is　placed　on　top　of　the　CSRR.　Results　show　that　the　Q-factor　of　the　CSRR　decreases　monotonously　with　increasing　sheet　resistance.　Experiments　were　performed　with　a　CSRR　resonating　at　around　1.9　GHz.　Silver　films,　with　sheet　resistance　ranging　from　similar　to　0.1　Ohm/sq　to　similar　to　1　Ohm/sq,　were　sputtered　on　1.1　mm　thick　glass.　Sheet　resistances　of　these　silver　films　were　measured　using　standard　four-point　probe　test.　Experimental　results　agree　qualitatively　well　with　simulations　and　quantitatively　match　with　the　proposed　fitting　formulas　describing　relationship　between　Qfactor　and　sheet　resistance.　Therefore,　it　is　possible　to　obtain　sheet　resistance　from　measured　Q-factor　along　with　the　fitting　formula.　The　proposed　sensor　is　low　cost　and　non-contact,　which　may　be　applied　to　applications　relating　to　conductive　thin　film　characterizations.