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Author:

Wang, Chuang (Wang, Chuang.) | Lizana, Ricardo F. (Lizana, Ricardo F..) | Li, Zunchao (Li, Zunchao.) | Peterchev, Angel V. (Peterchev, Angel V..) | Goetz, Stefan M. (Goetz, Stefan M..)

Indexed by:

CPCI-S Scopus EI

Abstract:

The modular multilevel converter with series and parallel connectivity was shown to provide advantages in several industrial applications. Its reliability largely depends on the absence of failures in the power semiconductors. We propose and analyze a fault-diagnosis technique to identify shorted switches based on features generated through wavelet transform of the converter output and subsequent classification in support vector machines. The multi-class support vector machine is trained with multiple recordings of the output of each fault condition as well as the converter under normal operation. Simulation results reveal that the proposed method has high classification latency and high robustness. Except for the monitoring of the output, which is required for the converter control in any case, this method does not require additional module sensors.

Keyword:

fault diagnosis modular multilevel converter support vector machines wavelet transform

Author Community:

  • [ 1 ] [Wang, Chuang; Li, Zunchao] Xi An Jiao Tong Univ, Xian 710049, Shaanxi, Peoples R China
  • [ 2 ] [Wang, Chuang; Lizana, Ricardo F.; Peterchev, Angel V.; Goetz, Stefan M.] Duke Univ, Durham, NC 27710 USA
  • [ 3 ] [Lizana, Ricardo F.] Univ Catolica Santisima Concepcion, Concepcion, Chile
  • [ 4 ] [Wang, Chuang]Xi An Jiao Tong Univ, Xian 710049, Shaanxi, Peoples R China
  • [ 5 ] [Li, Zunchao]Xi An Jiao Tong Univ, Xian 710049, Shaanxi, Peoples R China
  • [ 6 ] [Wang, Chuang]Duke Univ, Durham, NC 27710 USA
  • [ 7 ] [Lizana, Ricardo F.]Duke Univ, Durham, NC 27710 USA
  • [ 8 ] [Peterchev, Angel V.]Duke Univ, Durham, NC 27710 USA
  • [ 9 ] [Goetz, Stefan M.]Duke Univ, Durham, NC 27710 USA
  • [ 10 ] [Lizana, Ricardo F.]Univ Catolica Santisima Concepcion, Concepcion, Chile

Reprint Author's Address:

  • Duke Univ, Durham, NC 27710 USA.

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Source :

IECON 2017 - 43RD ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY

ISSN: 1553-572X

Year: 2017

Page: 3239-3244

Language: English

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 19

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

Affiliated Colleges:

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