Thin　films　with　large　compressive　residual　stress　and　low　interface　adhesion　can　buckle　and　delaminate　from　relatively　rigid　substrates,　which　is　a　common　failure　mode　of　film/substrate　interfaces.　Current　studies　mainly　focused　on　the　geometry　of　various　buckling　patterns　and　related　physical　origins　based　on　a　static　point　of　view.　However,　fundamental　understanding　of　dynamic　propagation　of　buckles,　particularly　for　the　complicated　web　buckles,　remains　challenging.　We　adopt　strained　two-dimensional　MoS2　thin　films　to　study　the　phenomenon　of　web　buckling　because　their　interface　adhesion,　namely　van　der　Waals　interaction,　is　naturally　low.　With　a　delicately　site-controlled　initiation,　web　buckles　can　be　triggered　and　their　dynamic　propagation　is　in　situ　observed　facilely.　Finite　element　modeling　shows　that　the　formation　of　web　buckles　involves　the　propagation　and　multilevel　branching　of　telephone-cord　blisters.　These　buckled　semiconducting　films　can　be　patterned　by　spatial　confinement　and　potentially　used　in　diffuse-reflective　coatings,　microfluidic　channels,　and　hydrogen　evolution　reaction　electrodes.　Our　work　not　only　reveals　the　hidden　mechanisms　and　kinematics　of　propagation　of　web　buckles　on　rigid　substrates　but　also　sheds　light　on　the　development　of　semiconducting　devices　based　on　buckling　engineering.