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Author:

Huo, Jinglan (Huo, Jinglan.) | Yong, Jiale (Yong, Jiale.) | Chen, Feng (Chen, Feng.) (Scholars:陈烽) | Yang, Qing (Yang, Qing.) | Fang, Yao (Fang, Yao.) | Hou, Xun (Hou, Xun.)

Indexed by:

SCIE EI Scopus

Abstract:

Controlling the behavior of underwater bubbles on a solid surface and establishing the contact model between a gas bubble and a solid substrate in a water medium have great significance. Herein, a method is proposed to realize the reversible switching between underwater superaerophilicity and superaerophobicity on the femtosecond laser-induced rough polytetrafluoroethylene (PTFE) surface by controlling the trapped air layer in water. The original femtosecond laser-structured PTFE surface is superhydrophobic in air and superaerophilic in water. After vacuum-pumping treatment, the trapped air layer around the microstructures of the underwater superhydrophobic PTFE surface is removed, leading to the underwater superaerophobicity of the sample surface. The trapped air layer can be recovered and the PTFE surface can regain the underwater superaerophilicity by drying treatment and the immersion of the sample in water again. Such a round-trip transition can achieve the bubble's "locating capture" and the control of the selective passage of air bubbles through a perforated rough PTFE sheet. It is believed that the resultant underwater superaerophobic and superaerophilic surfaces will have significant applications in manufacturing submarine gas-collection devices, improving the chemical reaction between liquid reagent and gas, and avoiding the microchannel blockage caused by bubbles in microfluidics and biosensor devices.

Keyword:

air bubbles femtosecond lasers superhydrophobicity underwater superaerophilicity underwater superaerophobicity

Author Community:

  • [ 1 ] [Huo, Jinglan; Yong, Jiale; Chen, Feng; Fang, Yao; Hou, Xun] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 2 ] [Huo, Jinglan; Yong, Jiale; Chen, Feng; Fang, Yao; Hou, Xun] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 3 ] [Yang, Qing] Xi An Jiao Tong Univ, Sch Mech Engn, Xian 710049, Peoples R China
  • [ 4 ] [Huo, Jinglan]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 5 ] [Yong, Jiale]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 6 ] [Chen, Feng]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 7 ] [Fang, Yao]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 8 ] [Hou, Xun]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 9 ] [Huo, Jinglan]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 10 ] [Yong, Jiale]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 11 ] [Chen, Feng]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 12 ] [Fang, Yao]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 13 ] [Hou, Xun]Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Shaanxi Key Lab Photon Technol Informat, Xian 710049, Peoples R China
  • [ 14 ] [Yang, Qing]Xi An Jiao Tong Univ, Sch Mech Engn, Xian 710049, Peoples R China

Reprint Author's Address:

  • [Yong, Jiale]State Key Laboratory for Manufacturing System Engineering and Shaanxi Key Laboratory of Photonics Technology for Information, School of Electronics & Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China;;

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Source :

ADVANCED MATERIALS INTERFACES

ISSN: 2196-7350

Year: 2019

Issue: 17

Volume: 6

4 . 9 4 8

JCR@2019

6 . 1 4 7

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:131

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 11

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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