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Author:

Liu, Wenyi (Liu, Wenyi.) | Xin, Jingmin (Xin, Jingmin.) (Scholars:辛景民) | Zuo, Weiliang (Zuo, Weiliang.) | Li, Jie (Li, Jie.) | Zheng, Nanning (Zheng, Nanning.) | Sano, Akira (Sano, Akira.)

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Abstract:

Source localization for near-field narrowband signal is an important topic in array signal processing. Deep neural network (DNN) based methods are data-driven and free of pre-assumptions about data model and are expected to learn the intricate nonlinear structure in large data sets. This paper proposes a framework of DNN where a regression layer is utilized to address the problem of near-field source localization. Unlike previous studies in which DOA estimation is modeled as a classification problem and have a relatively low resolution, we exploit a regression model and aim to improve the estimation accuracy. In the training stage, we propose a novel form of feature representation to take full advantage of the convolution networks. In addition, the architecture of deep neural networks is well designed taking in to consideration the trade-off between the expression ability and under-training risks. The simulation results show that the proposed approach has a rather high validation accuracy with a high resolution, and also outperforms some conventional methods in adverse environments such as low signal to noise ratio (SNR) or small number of snapshots. © 2019 IEEE

Keyword:

Array processing Deep neural networks Economic and social effects Regression analysis Signal to noise ratio

Author Community:

  • [ 1 ] [Liu, Wenyi]Institute of Artificial Intelligence and Robotics, Xi'an Jiaotong University, Xi'an; 710049, China; National Engineering Laboratory for Visual Information Processing and Applications, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Xin, Jingmin]Institute of Artificial Intelligence and Robotics, Xi'an Jiaotong University, Xi'an; 710049, China; National Engineering Laboratory for Visual Information Processing and Applications, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Zuo, Weiliang]Institute of Artificial Intelligence and Robotics, Xi'an Jiaotong University, Xi'an; 710049, China; National Engineering Laboratory for Visual Information Processing and Applications, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Li, Jie]Institute of Artificial Intelligence and Robotics, Xi'an Jiaotong University, Xi'an; 710049, China; National Engineering Laboratory for Visual Information Processing and Applications, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 5 ] [Zheng, Nanning]Institute of Artificial Intelligence and Robotics, Xi'an Jiaotong University, Xi'an; 710049, China; National Engineering Laboratory for Visual Information Processing and Applications, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 6 ] [Sano, Akira]Department of System Design Engineering, Keio University, Yokohama; 223-8522, Japan

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ISSN: 2219-5491

Year: 2019

Volume: 2019-September

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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