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Author:

Qin, Feng (Qin, Feng.) | Li, Bing (Li, Bing.) | Chen, Lei (Chen, Lei.) | Tang, Tao (Tang, Tao.) | Wei, Xiang (Wei, Xiang.) | Gao, Fei (Gao, Fei.) | Shang, Zhongyu (Shang, Zhongyu.)

Indexed by:

EI SCIE Scopus Engineering Village

Abstract:

A novel method is proposed for quantitative characterization of cracks by laser ultrasound. It is found that cracks with different depth will have different feedbacks to sound waves based on crack closure effect, energy loss theory and resonance phenomenon. Therefore, damage sensitive characteristic parameters can be extracted from the acoustic waves and used to quantitatively characterize the crack size, including the waveform duration, the reflection energy coefficient and frequency spectral area. In this paper, cracks with gradient depth are used as experimental objects, and the relevant data is obtained through simulation and experiments. The defects are positioned, and the positioning error is less than 3%. The study found that as the crack depth increases, the waveform duration and the reflection energy coefficient gradually decrease, and the frequency spectral area first increases and then decreases. When the crack depth is larger than 0.9mm, characteristic parameters tend to be fixed values. When the crack depth is 0.5mm-0.7mm, abrupt phenomena occurred in both the reflection energy coefficient and the frequency spectrum area due to resonance phenomenon. By analyzing the corresponding relationship between damage sensitivity characteristic parameters and depth, the ability of laser ultrasonic quantitative measurement can be improved. © 2020 Elsevier GmbH

Keyword:

Acoustic wave reflection Crack closure Crack propagation Energy dissipation Parameter estimation Resonance

Author Community:

  • [ 1 ] [Qin, Feng]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 2 ] [Qin, Feng]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 3 ] [Li, Bing]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 4 ] [Li, Bing]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 5 ] [Chen, Lei]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 6 ] [Chen, Lei]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 7 ] [Tang, Tao]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 8 ] [Tang, Tao]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 9 ] [Wei, Xiang]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 10 ] [Wei, Xiang]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 11 ] [Gao, Fei]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 12 ] [Gao, Fei]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China
  • [ 13 ] [Shang, Zhongyu]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China
  • [ 14 ] [Shang, Zhongyu]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China

Reprint Author's Address:

  • [Li, Bing]State Key Laboratory for Manufacture Systems Engineering, Xi'an Jiaotong University, No. 99 Yanxiang Road, Yanta District, Xi'an; Shaanxi; 710054, China;;[Li, Bing]International Joint Laboratory for micro/nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an; Shaanxi; 710049, China;;

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Source :

Optik

ISSN: 0030-4026

Year: 2020

Volume: 223

2 . 4 4 3

JCR@2020

2 . 4 4 3

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:54

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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