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Author:

Tu, Yiming (Tu, Yiming.) | Liu, Jinjun (Liu, Jinjun.) | Liu, Zeng (Liu, Zeng.) | Xue, Danhong (Xue, Danhong.) | Cheng, Li (Cheng, Li.)

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Abstract:

Digital control delay is studied as one of the leading factors causing instability in grid-tied voltage source inverter (VSI) systems. However, how this delay affects the small-signal output impedance of the VSI and how the change in impedance shape further influences the system stability are still not clear. This article, for the first time, thoroughly analyzes the impact of delay on the dq-frame output impedance of the VSI operating in both the single current loop control mode and the dual-loop control mode. It is found that when delay is considered, a distinct magnitude drop and a phase rise always exist at the high-frequency area of the impedance, which is named the 'impedance trough.' By studying the dq-frame output impedance of the VSI, the origin of the impedance trough, and its analytical relationships with the current loop dynamics, voltage loop dynamics, and delay values are unveiled. Meanwhile, the influence of the impedance trough on the stability of the grid-tied VSI system under these two control modes is evaluated through d-d channel impedance matching and generalized Nyquist criterion (GNC). It is demonstrated that the joint effects of delay and control parameters result in the impedance mismatch between the grid and the VSI, which is the root cause of high-frequency oscillations in the grid-tied system. Finally, experimental results verify the analysis. © 1986-2012 IEEE.

Keyword:

Digital control systems Electric inverters Impedance matching (electric) System stability

Author Community:

  • [ 1 ] [Tu, Yiming]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Liu, Jinjun]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Liu, Zeng]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Xue, Danhong]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 5 ] [Cheng, Li]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China

Reprint Author's Address:

  • [Liu, Jinjun]State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China;;

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Source :

IEEE Transactions on Power Electronics

ISSN: 0885-8993

Year: 2020

Issue: 11

Volume: 35

Page: 11666-11681

6 . 1 5 3

JCR@2020

6 . 1 5 3

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:59

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 27

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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