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Author:

Yonezu, Akio (Yonezu, Akio.) | Chen, Xi (Chen, Xi.)

Indexed by:

SCIE EI Scopus

Abstract:

The fracture mechanism of porous silicon carbide (SiC) was investigated by using the acoustic emission (AE) technique. Four point bending tests were conducted at different loading speeds, and integrated with AE monitoring. The results revealed that the quasi-static fatigue behavior had a critical role on the degradation of fracture strength, and fracture was caused by the microcracks of binder. For the AEs detected during the bending tests, source wave analysis of AE was carried out in order to quantitatively estimate the volume of microcrack. It was found that the crack volume was slightly smaller than that of binder fracture observed by a scanning electron microscope (SEM), thus suggested that the small crack propagates in the binder and produces AEs. It was also found that the longer the testing time, the smaller the rnicrocrack occurred at the lower stress level. Therefore, the fracture mechanism of the porous SiC was found to be controlled by particle binder fracture, which is time dependent. In addition, AE is testified as a useful technique to monitor the small crack of binder, which plays a very important role in material strength and filtering function of porous SiC. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

Keyword:

Acoustic Emission Fracture strength Microcrack Porous ceramics

Author Community:

  • [ 1 ] [Yonezu, Akio] Chuo Univ, Dept Precis Mech, Bunkyo Ku, Tokyo 1128551, Japan
  • [ 2 ] [Chen, Xi] Columbia Univ, Dept Earth & Environm Engn, New York, NY 10027 USA
  • [ 3 ] [Chen, Xi] Xi An Jiao Tong Univ, SV Lab, Sch Aerosp, Int Ctr Appl Mech, Xian 710049, Peoples R China

Reprint Author's Address:

  • Chuo Univ, Dept Precis Mech, Bunkyo Ku, 1-13-27 Kasuga, Tokyo 1128551, Japan.

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Source :

CERAMICS INTERNATIONAL

ISSN: 0272-8842

Year: 2014

Issue: 7

Volume: 40

Page: 9859-9866

2 . 6 0 5

JCR@2014

4 . 5 2 7

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:291

JCR Journal Grade:2

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 13

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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