The　interfacial　adhesion　of　contacting　pairs　between　two　adjacent　layers　of　2D　van　der　Waals　(vdW)　layered　materials　and　between　2D　materials　and　their　supporting　substrates　are　essential　for　manipulating　2D　materials　and　constructing　functional　2D　materials　incorporated　devices.　Here,　the　interfacial　adhesion　forces　and　energies　of　various　contacting　pairs　involving　2D　materials　and　their　underlying　physical　mechanisms　are　investigated　by　combining　atomic　force　microscopy　(AFM)　measurements　and　density　functional　theory　(DFT)　calculations.　The　distinct　adhesion　forces　are　verified　by　selecting　various　contacting　pairs　between　a　bare　or　graphene-coated　Si　tip　and　tungsten　disulfide　(WS2)　or　graphene　as　the　2D　materials.　When　using　the　bare　Si　tip,　the　adhesion　forces　between　tip　and　monolayer　WS2　or　bilayer　WS2　are　determined　as　32.07　nN　or　38.20　nN,　respectively.　The　adhesion　forces　between　the　graphene-coated　Si　tip　and　monolayer　WS2　or　graphene　are　14.80　nN　or　12.28　nN,　respectively.　Furthermore,　the　in-depth　density　functional　theory　(DFT)　calculation　results　indicate　that　a　distinctly　different　charge　transfer　contributes　to　the　different　magnitude　of　the　adhesion　forces.　Our　findings　demonstrate　that　the　interfacial　interaction　is　an　intrinsic　property　and　critically　dependent　on　the　type　of　2D　materials,　suggesting　a　potential　strategy　for　distinguishing　2D　materials　by　adhesion　forces.　©　2022　Elsevier　B.V.