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Author:

Wang, Yu (Wang, Yu.) | Zhang, Fan (Zhang, Fan.) | Chao, Shilin (Chao, Shilin.) | Zi, Yanyang (Zi, Yanyang.)

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Abstract:

In view of the nanoscale contact behavior of head disk interface at present, the improved GW model is proposed to evaluate micro contact force. And the intermolecular force is also introduced to establish the contact mechanical model of the head disk interface. Then the two degree of freedom dynamic model is performed on this contact mechanical model. The dynamic response characteristics of head under different contact states is analyzed by Runge Kutta method. The results demonstrate that when the flying height is lowered to a certain value, the contact will induce the self-excited vibration of the head, which is a key issue that affects the flying instability of the head. To verify the accuracy of the head-disk interface contact dynamics model, the heads with the same physical parameters as the dynamic model are selected to perform the dynamic response test under overload condition. It shows that the relative error between the theoretical calculation value of the model and the experimental test result is less than 8%. © 2022 Journal of Mechanical Engineering.

Keyword:

Chemical bonds Deformation Degrees of freedom (mechanics) Dynamic models Dynamic response End effectors Runge Kutta methods Vibrations (mechanical)

Author Community:

  • [ 1 ] [Wang, Yu]School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Zhang, Fan]School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Chao, Shilin]School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Zi, Yanyang]School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China

Reprint Author's Address:

  • Y. Wang;;School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, 710049, China;;email: ywang95@xjtu.edu.cn;;

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Source :

Journal of Mechanical Engineering

ISSN: 0577-6686

Year: 2022

Issue: 3

Volume: 58

Page: 121-130

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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