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Author:

Cheng, Huyue (Cheng, Huyue.) | Jiang, Hongquan (Jiang, Hongquan.) | Liu, Zhen (Liu, Zhen.) | Wang, Yonghong (Wang, Yonghong.) | Yang, Deyan (Yang, Deyan.) | Zhi, Zelin (Zhi, Zelin.)

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Abstract:

The internal defects of complex components are usually detected by X-ray, and the detection images generally have the problems of large gray change and low contrast. The research on image enhancement method is of great significance to improve the accuracy of defect recognition. To overcome the problems of adjusting parameters and the influence of personnel experience in traditional enhancement methods, this paper proposes a radiographic image enhancement method based on deep learning theory. Firstly, according to the requirements of radiographic image enhancement, the target data set of radiographic image enhancement is constructed. Secondly, using the deep learning theory, an improved U-Net network image enhancement model is designed to realize image structure preservation and noise removal. Finally, the proposed method is illustrated and verified by the radiographic images of complex metal components. © 2022 IEEE.

Keyword:

Complex networks Deep learning Defects Image enhancement X ray radiography

Author Community:

  • [ 1 ] [Cheng, Huyue]State Key Laboratory for Manufacturing Systems Engineering, Xi'An Jiaotong University, Xi'an, China
  • [ 2 ] [Jiang, Hongquan]State Key Laboratory for Manufacturing Systems Engineering, Xi'An Jiaotong University, Xi'an, China
  • [ 3 ] [Liu, Zhen]Xi'An Space Engine Company Limited, Xi'an, China
  • [ 4 ] [Wang, Yonghong]Xi'An Space Engine Company Limited, Xi'an, China
  • [ 5 ] [Yang, Deyan]State Key Laboratory for Manufacturing Systems Engineering, Xi'An Jiaotong University, Xi'an, China
  • [ 6 ] [Zhi, Zelin]State Key Laboratory for Manufacturing Systems Engineering, Xi'An Jiaotong University, Xi'an, China

Reprint Author's Address:

  • H. Jiang;;State Key Laboratory for Manufacturing Systems Engineering, Xi'An Jiaotong University, Xi'an, China;;email: jhqxjtu@163.com;;

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Year: 2022

Page: 913-918

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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