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Author:

Wang, Xingyu (Wang, Xingyu.) | Zhang, Zhen (Zhang, Zhen.) | Xu, Yafei (Xu, Yafei.) | Zhang, Liuyang (Zhang, Liuyang.) | Yan, Ruqiang (Yan, Ruqiang.) | Chen, Xuefeng (Chen, Xuefeng.) (Scholars:陈雪峰)

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SCIE EI Scopus Web of Science

Abstract:

Terahertz (THz) imaging has been widely used in industrial nondestructive testing (NDT) of nonpolar materials due to its unique property. Minor defect detection via THz NDT at high accuracy and fast speed is essential for industrial online detection systems. However, traditional defect detection algorithms cannot meet the demand of real-time high-precision detection of minor defects. Therefore, based on the you only look once x (YOLOX) algorithm and multiscale attention (MSA) mechanism, the modified YOLOX network called YOLOX-MSA is proposed as a one-stage minor defect detection framework to improve the detection accuracy while supporting the real-time operation. The proposed YOLOX-MSA network improves the mean average precision (mAP) by at least 11.65% on the printed circuit board (PCB) dataset with THz characteristics when the intersection over union (IoU) is 0.75. In addition, the proposed algorithm can reach the detection speed as 24-25 frames per second (FPS). Overall, our proposed method can be beneficial to generalize the THz NDT in the frequency domain on the minor defects of nonpolar material, which will fulfill the impending requirements of real-time defect detection for industrial applications.

Keyword:

Detectors Feature extraction Head Imaging Industrial nondestructive testing (NDT) Merging minor defect detection printed circuit boards (PCBs) Real-time systems terahertz (THz) characteristics Transformers you only look once x-multiscale attention (YOLOX-MSA)

Author Community:

  • [ 1 ] [Wang, Xingyu]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 2 ] [Zhang, Zhen]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 3 ] [Xu, Yafei]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 4 ] [Zhang, Liuyang]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 5 ] [Yan, Ruqiang]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 6 ] [Chen, Xuefeng]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 7 ] [Wang, Xingyu]Xian Jiaotong Univ Shenzhen Acad, Shenzhen 518057, Peoples R China
  • [ 8 ] [Zhang, Liuyang]Xian Jiaotong Univ Shenzhen Acad, Shenzhen 518057, Peoples R China

Reprint Author's Address:

  • L. Zhang;;Xi'an Jiaotong University, State Key Laboratory for Manufacturing Systems Engineering, Xi'an, 710049, China;;email: liuyangzhang@xjtu.edu.cn;;

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Source :

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

ISSN: 0018-9456

Year: 2022

Volume: 71

4 . 0 1 6

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:7

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 21

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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