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Keyword:
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Source :
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE
ISSN: 1094-6969
Year: 2016
Issue: 2
Volume: 19
Page: 22-28
1 . 4 3 8
JCR@2016
1 . 5 0 5
JCR@2020
ESI Discipline: ENGINEERING;
ESI HC Threshold:128
JCR Journal Grade:3
CAS Journal Grade:4
Cited Count:
WoS CC Cited Count: 18
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 1