Energy storage properties of PLZST-based antiferroelectric ceramics with glass additives for low-temperature sintering - Details

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Abstract：

PLZST-based　antiferroelectric　(AFE)　ceramics　with　high　recoverable　energy　density　(Wre)　and　efficiency　(η)　can　be　applied　to　pulsed　power　electronic　devices.　However,　this　application　is　constrained　by　the　high　sintering　temperature　(ST,　1250–1320　°C)　of　the　ceramics　per　se.　In　this　context,　this　study　introduced　a　new　glass　phase　of　Ba2CO3–Al2O3–SiO2–K2CO3　(BASK)　into　Pb0.95La0.02Sr0.02(Zr0.50Sn0.40Ti0.10)O3　(PLSZST)　AFE　ceramics　by　using　a　traditional　solid-state　method.　By　doping　0.5　wt%　BASK,　the　ST　of　PLSZST　ceramics　was　significantly　reduced　from　1300　°C　to　1020　°C　and　a　high　Wre　of　3.54　J/cm3　and　a　high　η　of　86%　were　yield,　when　the　electric　breakdown　strength　increased　to　230　kV/cm.　In　addition,　a　pulse　discharge　energy　density　of　2.47　J/cm3,　and　an　extremely　fast　discharge　speed　(re　and　η　within　30–110　°C　temperature　range,　were　achieved.　Conclusively,　this　AFE　ceramic　composition　with　glass　additives　has　a　great　potential　to　be　used　in　base　metal　inner-electrode　multilayer　ceramic　capacitors　for　pulse　power　applications.　©　2022　Elsevier　Ltd　and　Techna　Group　S.r.l.

Keyword：

Additives Alumina Aluminum oxide Barium compounds Ceramic materials Electric discharges Energy storage Glass Lead compounds Silica Sintering Strontium compounds Temperature Tin compounds Zirconium compounds

Author Community：

[ 1 ] [Sun, Hongchen]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 2 ] [Xu, Ran]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 3 ] [Wang, Xiaozhi]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 4 ] [Zhu, Qingshan]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 5 ] [Lan, Yu]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 6 ] [Wang, Mengjiao]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 7 ] [Wei, Xiaoyong]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 8 ] [Feng, Yujun]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 9 ] [Xu, Zhuo]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
[ 10 ] [Yao, Xi]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China

Reprint Author's Address：

X. Wei;;Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, 710049, China;;email: wdy@mail.xjtu.edu.cn;;Y. Feng;;Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, 710049, China;;email: fyj@xjtu.edu.cn;;

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Source ：

Ceramics International

ISSN： 0272-8842

Year： 2023

Issue： 2

Volume： 49

Page： 2591-2599

4 . 5 2 7

JCR@2020

ESI Discipline： MATERIALS SCIENCE;

Cited Count：

WoS CC Cited Count：

SCOPUS Cited Count： 16

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 6

Affiliated Colleges：

电子与信息工程学部（原电子与信息工程学院）精细功能电子材料与器件国家专项实验室

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