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Author:

Han, JJ (Han, JJ.) | Chen, YH (Chen, YH.)

Indexed by:

SCIE Scopus EI

Abstract:

The paper deals with the analysis of the T-effect in the problem of an interface macrocrack interacting with a microvoid in the process zone of the main crack tip. With the aid of the 'pseudo-traction-edge-dislocation' method. the interaction problem with the T-effect under the remote held loading conditions can be reduced to singular Fredholm integral equations with Hilbert kernel. After solving the singular integral equations numerically, the T-effect on the main crack tip parameters is analyzed and the numerical results are given in figures.

Keyword:

amplification interaction interface macrocrack microhole shielding T-effect T-stress

Author Community:

  • [ 1 ] Xian Jiao Tong Univ, Sch Civil Engn & Mech, Xian 710049, Peoples R China

Reprint Author's Address:

  • Xian Jiao Tong Univ, Sch Civil Engn & Mech, Xian 710049, Peoples R China.

Email:

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Source :

INTERNATIONAL JOURNAL OF FRACTURE

ISSN: 0376-9429

Year: 2000

Issue: 3

Volume: 102

Page: 205-222

0 . 5 3 1

JCR@2000

2 . 3 7 4

JCR@2020

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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