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Author:

Zhang, R (Zhang, R.) | Wan, MX (Wan, MX.) (Scholars:万明习) | Cao, WW (Cao, WW.)

Indexed by:

SCIE Scopus EI

Abstract:

A low-frequency ultrasonic method presented in this paper is suitable for measuring any one of the four characteristic parameters, i.e., thickness, density, shear, and longitudinal wave velocities, of a thin elastic layer given the remaining three. Thickness of the thin layer is much smaller than the longitudinal wavelength of the ultrasonic wave used in the experiments. The method employs the water immersion pitch-catch technique, and is based on the dispersion properties of the first-order symmetric and anti-symmetric modes of a Lamb waveguide. The unknown parameter is estimated by minimizing the mean square error obtained by comparing theoretical dispersion curves with experimental data. A wide-band excitation technique is used to reduce measurement time, by which a frequency range of possible guided Lamb waves is simultaneously explored. The sensitivity and accuracy of the proposed technique for different parameters in different thicknesses are analyzed. Using the present technique, a thin layer with thickness down to one percent of the longitudinal wavelength can be successfully measured with an average error of about two-percent. But the method fails to evaluate the density of the thin layer if the thickness is less than five percent of longitudinal wavelength.

Keyword:

dispersion Lamb wave nondestructive evaluation (NDE) thin layer ultrasonics

Author Community:

  • [ 1 ] Xian Jiaotong Univ, Dept Biomed Engn, Xian 710049, Peoples R China
  • [ 2 ] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA

Reprint Author's Address:

  • Xian Jiaotong Univ, Dept Biomed Engn, Xian 710049, Peoples R China.

Email:

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Source :

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

ISSN: 0018-9456

Year: 2001

Issue: 5

Volume: 50

Page: 1397-1403

0 . 9

JCR@2001

4 . 0 1 6

JCR@2020

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 19

SCOPUS Cited Count: 26

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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