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Abstract:
The material databases for the Vaughan's secondary electron model which is popularly utilized in the plasma simulation are abundant. Most of them are highly accurate and reliable, due to the validations of experiments. In order to integrate these precious databases into our electromagnetic-particle simulation platform and improve the computational precision of our simulation platform, the classic Vaughan's model for the secondary electron emission is firstly researched. Based on the derivation of the numerical method to generate the actual number of secondary electrons, the way to calculate the energy of each secondary electron and the method to obtain the emissive angle are successfully proposed. Due to our work, it is more convenient to numerically implement the Vaughan's theorem in practical applications. Furthermore, the accuracy and the robustness of our proposed methods are validated by the computational results in this paper.
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Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
ISSN: 1001-4322
Year: 2013
Issue: 11
Volume: 25
Page: 3035-3039
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count: 3
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
Chinese Cited Count: -1
30 Days PV: 16
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