The　material　databases　for　the　Vaughan＇s　secondary　electron　model　which　is　popularly　utilized　in　the　plasma　simulation　are　abundant.　Most　of　them　are　highly　accurate　and　reliable,　due　to　the　validations　of　experiments.　In　order　to　integrate　these　precious　databases　into　our　electromagnetic-particle　simulation　platform　and　improve　the　computational　precision　of　our　simulation　platform,　the　classic　Vaughan＇s　model　for　the　secondary　electron　emission　is　firstly　researched.　Based　on　the　derivation　of　the　numerical　method　to　generate　the　actual　number　of　secondary　electrons,　the　way　to　calculate　the　energy　of　each　secondary　electron　and　the　method　to　obtain　the　emissive　angle　are　successfully　proposed.　Due　to　our　work,　it　is　more　convenient　to　numerically　implement　the　Vaughan＇s　theorem　in　practical　applications.　Furthermore,　the　accuracy　and　the　robustness　of　our　proposed　methods　are　validated　by　the　computational　results　in　this　paper.