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Author:

Jin, Li (Jin, Li.) | Qiao, Jun (Qiao, Jun.) | Hou, Lei (Hou, Lei.) | Tian, Ye (Tian, Ye.) | Hu, Qingyuan (Hu, Qingyuan.) | Wang, Liang (Wang, Liang.) | Lu, Xu (Lu, Xu.) | Zhang, Lin (Zhang, Lin.) | Du, Hongliang (Du, Hongliang.) | Wei, Xiaoyong (Wei, Xiaoyong.) | Liu, Gang (Liu, Gang.) | Yan, Yan (Yan, Yan.)

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EI Scopus SCIE Download Full text

Abstract:

Recently electrostrictive effect in ferroelectrics has attracted much attention, since the electric field-induced strain based on such an effect possesses an ultra-low hysteresis, which is of special interest to both fundamental research and potential application in high-precision actuators. In this paper, we propose a strategy to obtain high electrostrictive properties in ABO3 perovskite structure BaTiO3 (BT)-based ferroelectric ceramics by means of doping. The doping element, amount, valence as well as position are specified according to this strategy. It is suggested that B-site Sn4+-doped BT, i.e., Ba(Ti1-xSnx)O3 (BTS), would possess superior electrostrictive properties. The structural evolution and electrical properties of BTS ferroelectric ceramics were investigated in detail in order to verify this deduction. Besides the ferroelectric-to-relaxor transition with respect to the increase of x from 0.06 to 0.11, expected and high electric field-induced strain (> 0.08% at 40 kV/cm) with a very ultra-low hysteresis (< 8%) is obtained in x = 0.10–0.11 compositions. High longitudinal electrostrictive coefficient Q33 ranges from to 0.0398 m4/C2 to 0.0515 m4/C2 accompanying with temperature- and composition-insensitive characteristics. These results not only prove the effectiveness of this strategy, but also pave a way to search for novel kinds of electrostrictive systems in ferroelectrics. © 2018 Elsevier Ltd and Techna Group S.r.l.

Keyword:

Barium stannate titanate Electric-field-induced strain Electrostrictive coefficients Electrostrictive effects Ferroelectric-to-relaxor Lead-Free Lead-free ferroelectrics Structural evolution

Author Community:

  • [ 1 ] [Jin, Li;Qiao, Jun;Hou, Lei;Tian, Ye;Hu, Qingyuan;Wang, Liang;Lu, Xu;Zhang, Lin;Du, Hongliang;Wei, Xiaoyong]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Liu, Gang;Yan, Yan]Faculty of Materials and Energy, Southwest University, Chongqing; 400715, China
  • [ 3 ] [Jin, Li; Qiao, Jun; Hou, Lei; Tian, Ye; Hu, Qingyuan; Wang, Liang; Lu, Xu; Zhang, Lin; Du, Hongliang; Wei, Xiaoyong] Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 4 ] [Jin, Li; Qiao, Jun; Hou, Lei; Tian, Ye; Hu, Qingyuan; Wang, Liang; Lu, Xu; Zhang, Lin; Du, Hongliang; Wei, Xiaoyong] Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 5 ] [Liu, Gang; Yan, Yan] Southwest Univ, Fac Mat & Energy, Chongqing 400715, Peoples R China
  • [ 6 ] [Jin, Li]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 7 ] [Qiao, Jun]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 8 ] [Hou, Lei]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 9 ] [Tian, Ye]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 10 ] [Hu, Qingyuan]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 11 ] [Wang, Liang]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 12 ] [Lu, Xu]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 13 ] [Zhang, Lin]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 14 ] [Du, Hongliang]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 15 ] [Wei, Xiaoyong]Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China
  • [ 16 ] [Jin, Li]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 17 ] [Qiao, Jun]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 18 ] [Hou, Lei]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 19 ] [Tian, Ye]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 20 ] [Hu, Qingyuan]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 21 ] [Wang, Liang]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 22 ] [Lu, Xu]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 23 ] [Zhang, Lin]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 24 ] [Du, Hongliang]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 25 ] [Wei, Xiaoyong]Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China
  • [ 26 ] [Liu, Gang]Southwest Univ, Fac Mat & Energy, Chongqing 400715, Peoples R China
  • [ 27 ] [Yan, Yan]Southwest Univ, Fac Mat & Energy, Chongqing 400715, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian 710049, Peoples R China.; Jin, L; Du, HL (reprint author), Xi An Jiao Tong Univ, Int Ctr Dielect Res, Sch Elect & Informat Engn, Xian 710049, Peoples R China.; Yan, Y (reprint author), Southwest Univ, Fac Mat & Energy, Chongqing 400715, Peoples R China.

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Source :

Ceramics International

ISSN: 0272-8842

Year: 2018

Issue: 17

Volume: 44

Page: 21816-21824

3 . 4 5

JCR@2018

4 . 5 2 7

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:182

JCR Journal Grade:2

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 28

SCOPUS Cited Count: 47

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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