Estimating　the　radiation　sensitivity　and　radiation　response　of　individual　electronic　units　embedded　in　System　on　chip　(SoC)　is　important　for　SoC　error　rate　predicting　and　fault　tolerant　system　designing.　In　this　paper,　the　experimental　techniques　for　detecting　the　single　event　effects　(SEE)　of　SoC　were　introduced.　The　test　system　has　been　established　and　the　irradiation　experiments　have　been　performed　for　testing　SEE　of　Xilinx　Zynq-7010　SoC　with　Pu-239　alpha　radiation　source.　Several　single　events　functional　Interrupt　(SEFI)　of　some　typical　registers　within　the　SoC　sample　were　detected　after　receiving　the　total　fluence　of　6.101　x　10(5)　p/cm(2).　In　the　end,　the　mechanisms　of　SEFI　induced　by　alpha　irradiation　on　SoC　were　discussed　and　analyzed.