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Author:

Shen, Qingming (Shen, Qingming.) | Gao, Jianmin (Gao, Jianmin.) (Scholars:高建民) | Li, Cheng (Li, Cheng.)

Indexed by:

SCIE EI Scopus

Abstract:

There are two problems that affect the accuracy of defect classification for automated radiographic NDT. One is the poor generalisation of the classification method led by a small training sample or an improper classifier, and the other is the poor separability of the feature group. To solve the former, we propose a method based on the direct multiclass support vector machine (DMSVM) to classify the defect, which has good generalisation under the circumstances of a small training set. To tackle the latter, we suggest four new features (three of them are based on the defect region) to characterise the defect, which greatly improve the separability of the feature group. Three classifiers (one-versus-rest SVM, one-versus-one SVM and MLP neuron network) and a group of feathers are used to compare with the classifier and the feature group we proposed. The bootstrap estimate is used to estimate their performances. The eyperimental results demonstrate that the bootstrap accuracy estimate of DMSVM is 94.25%, which is higher than that achieved by the three compared classifiers. Moreover, the separability of the suggested feature group is equivalent to that of the counterpart but with a two-thirds size, and the computation time is cut by 22.17%.

Keyword:

classification defects direct multiclass SVM Features

Author Community:

  • [ 1 ] [Shen, Qingming; Gao, Jianmin; Li, Cheng] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China.

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Source :

INSIGHT

ISSN: 1354-2575

Year: 2010

Issue: 3

Volume: 52

Page: 134-139

0 . 4 3 1

JCR@2010

0 . 8 7 8

JCR@2020

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 22

SCOPUS Cited Count: 28

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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