Radiation-induced　soft　errors　are　an　increasingly　important　threat　to　the　reliability　of　modern　electronic　systems.　In　order　to　evaluate　system-on　chip＇s　reliability　and　soft　error,　the　fault　tree　analysis　method　was　used　in　this　work.　The　system　fault　tree　was　constructed　based　on　Xilinx　Zynq-7010　All　Programmable　SoC.　Moreover,　the　soft　error　rates　of　different　components　in　Zynq-7010　SoC　were　tested　by　americium　-241　alpha　radiation　source.　Furthermore,　some　parameters　that　used　to　evaluate　the　system＇s　reliability　and　safety　were　calculated　using　Isograph　Reliability　Workbench　11.0,　such　as　failure　rate,　unavailability　and　mean　time　to　failure　(MTTF).　According　to　fault　tree　analysis　for　system　-on　chip,　the　critical　blocks　and　system　reliability　were　evaluated　through　the　qualitative　and　quantitative　analysis.　(C)　2016　Elsevier　B.V.　All　rights　reserved.