An　accurate　and　cost-effective　method　for　ADC　jitter　estimation　is　proposed.　The　new　method　only　requires　a　single　high-frequency　test.　Eliminating　the　need　for　a　2nd　low-frequency　test　in　the　conventional　dual-frequency　tests　can　significantly　save　both　hardware　and　data　acquisition　time.　Furthermore,　the　proposed　method　does　not　require　the　condition　of　coherent　sampling　and　expensive　instruments.　Theoretical　analysis,　simulation　and　experimental　results　show　that　the　proposed　method　is　cost-effective　and　can　achieve　the　test　accuracy　comparable　to　conventional　dual-frequency　tests.