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Author:

Chen, Xiong (Chen, Xiong.) | He, Yongning (He, Yongning.) | Cui, Wanzhao (Cui, Wanzhao.) | Pommerenke, David J. (Pommerenke, David J..) | Fan, Jun (Fan, Jun.)

Indexed by:

CPCI-S CSSCI-E

Abstract:

As a key step to guarantee passive intermodulation (PIM) test accuracy, PIM calibration for PIM tester draws great attention these days. This paper provides three solutions to realize tunable PIM calibration standard sources for PIM tester calibration. Two types of nonlinearity sources are applied while three circuit or cavity structures are developed to control these sources. By using different strategies, the proposed PIM sources can generate controllable PIM references with different ranges that cover most PIM test ranges. In the experiments, the PIM signal stability is evaluated as well as PIM dynamic range. They show the minimal PIM fluctuation as less as 1dB, while the maximal dynamic range can reach 50dB. As these solutions have various sizes and function, they can be utilized according to different test requirements and easily integrated with PIM tester. These solutions can help develop new generation of PIM testers.

Keyword:

Automatic IM tuning IM reference source passive intermodulation calibration

Author Community:

  • [ 1 ] [Chen, Xiong; He, Yongning] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Xian, Shaanxi, Peoples R China
  • [ 2 ] [Cui, Wanzhao] China Acad Space Technol, Sci & Technol Space Microwave Lab, Xian, Shaanxi, Peoples R China
  • [ 3 ] [Chen, Xiong; Pommerenke, David J.; Fan, Jun] Missouri Univ Sci & Technol, EMC Lab, Rolla, MO USA

Reprint Author's Address:

  • Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Xian, Shaanxi, Peoples R China.; Chen, X (reprint author), Missouri Univ Sci & Technol, EMC Lab, Rolla, MO USA.

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Source :

2018 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL INTEGRITY AND POWER INTEGRITY (EMC, SI & PI)

Year: 2018

Page: 510-515

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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