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Author:

Du, Zhaohui (Du, Zhaohui.) | Chen, Xuefeng (Chen, Xuefeng.) (Scholars:陈雪峰) | Zhang, Han (Zhang, Han.) | Yan, Ruqiang (Yan, Ruqiang.)

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SCIE EI Scopus

Abstract:

A primary challenge in fault diagnosis is to extract multiple components entangled within a noisy observation. Therefore, this paper describes and analyzes a novel framework, based on convex optimization, for simultaneously identifying multiple features from superimposed signals. This work adequately exploits the underlying prior information that multiple faults with similar frequency spectrum have different morphological waveforms that can be sparsely represented over the union of redundant dictionaries. Within this framework, prior information is formulated into regularization terms, and a sparse optimization problem, which can be solved through the alternating direction method of multipliers (ADMM), is proposed. Meanwhile, the convergence and computational complexity of the proposed iterative framework are profoundly investigated. Moreover, sensitivity analyses and adaptive selection rules for the regularization parameters are described in detail through a set of comprehensive numerical studies. The proposed framework is validated through performing the diagnosis of multiple faults for gearbox in a wind farm. The comparison with respect to the state of the art in the field is illustrated in detail, which highlights the superiority of the proposed framework.

Keyword:

Alternating direction method of multipliers (ADMM) diagnosis of multiple faults fault diagnosis morphological waveform parameter selection redundant dictionary regularization term sparse feature identification wind turbine (WT) gearbox

Author Community:

  • [ 1 ] [Du, Zhaohui; Chen, Xuefeng; Zhang, Han] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 2 ] [Yan, Ruqiang] Southeast Univ, Sch Instrument Sci & Engn, Nanjing 210096, Jiangsu, Peoples R China
  • [ 3 ] [Du, Zhaohui]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 4 ] [Chen, Xuefeng]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 5 ] [Zhang, Han]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 6 ] [Yan, Ruqiang]Southeast Univ, Sch Instrument Sci & Engn, Nanjing 210096, Jiangsu, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China.

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Source :

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

ISSN: 0278-0046

Year: 2015

Issue: 10

Volume: 62

Page: 6594-6605

6 . 3 8 3

JCR@2015

8 . 2 3 6

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:138

JCR Journal Grade:2

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 115

SCOPUS Cited Count: 149

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 13

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