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To understand the effects of tellurium (Te) inclusions on the device performance of CdZnTe radiation detectors, the perturbation of the electrical field in and around Te inclusions was studied in CdZnTe single crystals via Kelvin probe force microscopy (KPFM). Te inclusions were proved to act as lower potential centers with respect to surrounding CdZnTe matrix. Based on the KPFM results, the energy band diagram at the Te/CdZnTe interface was established, and the bias-dependent effects of Te inclusion on carrier transportation is discussed. (C) 2016 Elsevier Ltd. All rights reserved.
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MICRON
ISSN: 0968-4328
Year: 2016
Volume: 88
Page: 48-53
1 . 9 8
JCR@2016
2 . 2 5 1
JCR@2020
ESI Discipline: BIOLOGY & BIOCHEMISTRY;
ESI HC Threshold:182
JCR Journal Grade:3
CAS Journal Grade:3
Cited Count:
WoS CC Cited Count: 6
SCOPUS Cited Count: 5
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 3