Electrokinetic　flow,　due　to　a　nearly　plug-like　velocity　profile,　is　the　preferred　mode　for　transport　of　fluids　(by　electroosmosis)　and　species　(by　electrophoresis　if　charged)　in　microfluidic　devices.　Thus　far　there　have　been　numerous　studies　on　electrokinetic　flow　within　a　variety　of　microchannel　structures.　However,　the　fluid　and　species　behaviors　at　the　interface　of　the　inlet　reservoir　(i.e.,　the　well　that　supplies　the　fluid　and　species)　and　microchannel　are　still　largely　unexplored.　This　work　presents　a　fundamental　investigation　of　the　induced　charge　effects　on　electrokinetic　entry　flow　due　to　the　polarization　of　dielectric　corners　at　the　inlet　reservoir-microchannel　junction.　We　use　small　tracing　particles　suspended　in　a　low　ionic　concentration　fluid　to　visualize　the　electrokinetic　flow　pattern　in　the　absence　of　Joule　heating　effects.　Particles　are　found　to　get　trapped　and　concentrated　inside　a　pair　of　counter-rotating　fluid　circulations　near　the　corners　of　the　channel　entrance.　We　also　develop　a　depth-averaged　numerical　model　to　understand　the　induced　charge　on　the　corner　surfaces　and　simulate　the　resultant　induced　charge　electroosmosis　(ICEO)　in　the　horizontal　plane　of　the　microchannel.　The　particle　streaklines　predicted　from　this　model　are　compared　with　the　experimental　images　of　tracing　particles,　which　shows　a　significantly　better　agreement　than　those　from　a　regular　two-dimensional　model.　This　study　indicates　the　strong　influences　of　the　top/bottom　walls　on　ICEO　in　shallow　microchannels,　which　have　been　neglected　in　previous　two-dimensional　models.　Published　by　AIP　Publishing.