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Author:

Bai, Li-Na (Bai, Li-Na.) | Liu, Hai-Dong (Liu, Hai-Dong.) | Zhou, Wei (Zhou, Wei.) | Zhang, Yong (Zhang, Yong.) | Zhai, Hong-Qi (Zhai, Hong-Qi.) | Cui, Zhen-Jian (Cui, Zhen-Jian.) | Zhao, Ming-Ying (Zhao, Ming-Ying.) | Gu, Xiao-Qian (Gu, Xiao-Qian.) | Liu, Bei-Ling (Liu, Bei-Ling.) | Huang, Li-Bei (Huang, Li-Bei.)

Indexed by:

SCIE EI Scopus CSCD

Abstract:

The digital measurement and processing is an important direction in the measurement and control field. The quantization error widely existing in the digital processing is always the decisive factor that restricts the development and applications of the digital technology. In this paper, we find that the stability of the digital quantization system is obviously better than the quantization resolution. The application of a border effect in the digital quantization can greatly improve the accuracy of digital processing. Its effective precision has nothing to do with the number of quantization bits, which is only related to the stability of the quantization system. The high precision measurement results obtained in the low level quantization system with high sampling rate have an important application value for the progress in the digital measurement and processing field.

Keyword:

border effect digital converter (ADC) quantization error

Author Community:

  • [ 1 ] [Bai, Li-Na; Liu, Hai-Dong; Zhou, Wei; Zhai, Hong-Qi; Cui, Zhen-Jian; Zhao, Ming-Ying; Gu, Xiao-Qian; Liu, Bei-Ling; Huang, Li-Bei] Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 2 ] [Zhang, Yong] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China
  • [ 3 ] [Bai, Li-Na]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 4 ] [Liu, Hai-Dong]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 5 ] [Zhou, Wei]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 6 ] [Zhai, Hong-Qi]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 7 ] [Cui, Zhen-Jian]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 8 ] [Zhao, Ming-Ying]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 9 ] [Gu, Xiao-Qian]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 10 ] [Liu, Bei-Ling]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 11 ] [Huang, Li-Bei]Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China
  • [ 12 ] [Zhang, Yong]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China

Reprint Author's Address:

  • Xidian Univ, Dept Measurement & Instrumentat, Xian 710071, Shaanxi, Peoples R China.

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Source :

CHINESE PHYSICS B

ISSN: 1674-1056

Year: 2017

Issue: 9

Volume: 26

1 . 3 2 1

JCR@2017

1 . 4 9 4

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:120

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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