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Author:

Zhang, Han (Zhang, Han.) | Chen, Xuefeng (Chen, Xuefeng.) (Scholars:陈雪峰) | Du, Zhaohui (Du, Zhaohui.) | Yang, Boyuan (Yang, Boyuan.)

Indexed by:

SCIE EI Scopus

Abstract:

It is a challenging problem to design excellent dictionaries to sparsely represent diverse fault information and simultaneously discriminate different fault sources. Therefore, this paper describes and analyzes a novel multiple feature recognition framework which incorporates the tight frame learning technique with an adaptive subspace recognition strategy. The proposed framework consists of four stages. Firstly, by introducing the tight frame constraint into the popular dictionary learning model, the proposed tight frame learning model could be formulated as a nonconvex optimization problem which can be solved by alternatively implementing hard thresholding operation and singular value decomposition. Secondly, the noises are effectively eliminated through transform sparse coding techniques. Thirdly, the denoised signal is decoupled into discriminative feature subspaces by each tight frame filter. Finally, in guidance of elaborately designed fault related sensitive indexes, latent fault feature subspaces can be adaptively recognized and multiple faults are diagnosed simultaneously. Extensive numerical experiments are sequently implemented to investigate the sparsifying capability of the learned tight frame as well as its comprehensive denoising performance. Most importantly, the feasibility and superiority of the proposed framework is verified through performing multiple fault diagnosis of motor bearings. Compared with the state-of-the-art fault detection techniques, some important advantages have been observed: firstly, the proposed framework incorporates the physical prior with the data-driven strategy and naturally multiple fault feature with similar oscillation morphology can be adaptively decoupled. Secondly, the tight frame dictionary directly learned from the noisy observation can significantly promote the sparsity of fault features compared to analytical tight frames. Thirdly, a satisfactory complete signal space description property is guaranteed and thus weak feature leakage problem is avoided compared to typical learning methods. (C) 2017 Elsevier Ltd. All rights reserved.

Keyword:

Dictionary learning Discriminative indexes Multiple feature decoupling Nonconvex optimization Sparse representation Transform sparse coding

Author Community:

  • [ 1 ] [Zhang, Han; Chen, Xuefeng; Du, Zhaohui; Yang, Boyuan] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 2 ] [Zhang, Han; Chen, Xuefeng; Yang, Boyuan] Xi An Jiao Tong Univ, Collaborat Innovat Ctr High End Mfg Equipment, Xian 710054, Peoples R China
  • [ 3 ] [Du, Zhaohui] Univ Calif Los Angeles, Dept Math, Los Angeles, CA 90095 USA
  • [ 4 ] [Zhang, Han]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 5 ] [Chen, Xuefeng]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 6 ] [Du, Zhaohui]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 7 ] [Yang, Boyuan]Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China
  • [ 8 ] [Zhang, Han]Xi An Jiao Tong Univ, Collaborat Innovat Ctr High End Mfg Equipment, Xian 710054, Peoples R China
  • [ 9 ] [Chen, Xuefeng]Xi An Jiao Tong Univ, Collaborat Innovat Ctr High End Mfg Equipment, Xian 710054, Peoples R China
  • [ 10 ] [Yang, Boyuan]Xi An Jiao Tong Univ, Collaborat Innovat Ctr High End Mfg Equipment, Xian 710054, Peoples R China
  • [ 11 ] [Du, Zhaohui]Univ Calif Los Angeles, Dept Math, Los Angeles, CA 90095 USA

Reprint Author's Address:

  • 陈雪峰

    Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710049, Peoples R China.

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Source :

MECHANICAL SYSTEMS AND SIGNAL PROCESSING

ISSN: 0888-3270

Year: 2017

Volume: 94

Page: 499-524

4 . 3 7

JCR@2017

6 . 8 2 3

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:121

JCR Journal Grade:2

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 27

SCOPUS Cited Count: 30

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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