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Author:

Zhou, Yiqiong (Zhou, Yiqiong.) | Xu, Siyu (Xu, Siyu.) | Jin, Congcong (Jin, Congcong.) | Guo, Ziyi (Guo, Ziyi.)

Indexed by:

SCIE EI Scopus

Abstract:

Many methods have been proposed and improved to deal with multi-view point cloud registration. Most of them are based on the classical method, namely Iterative Closest Point(ICP), which is fast and accurate in most cases. However in the presence of noise and outliers, the equal weights ICP assigned to all correspondences would lead to unsatisfactory registration results. To address this issue, this paper proposes a new automatic multi-view registration method based on Expectation Maximization(EM). A Gaussian distribution on representing the relationship between point-sets according to their distance was introduced first. Then EM is brought in to optimize the likelihood function formulated with above Gaussian distribution. Through an iterative method the multi-view registration results can be obtained at last. The experimental results demonstrate accuracy and robustness of our methods over four state-of-the-art algorithms, especially when noisy data exist.

Keyword:

Expectation Maximization algorithm Gaussian distribution Iterative Closest Point Multi-view registration Noise

Author Community:

  • [ 1 ] [Zhou, Yiqiong; Xu, Siyu; Jin, Congcong] Xi An Jiao Tong Univ, Sch Software Engn, Xian, Shaanxi, Peoples R China
  • [ 2 ] [Guo, Ziyi] Univ Elect Sci & Technol China, Sch Comp Sci & Engn, Chengdu, Sichuan, Peoples R China
  • [ 3 ] [Zhou, Yiqiong]Xi An Jiao Tong Univ, Sch Software Engn, Xian, Shaanxi, Peoples R China
  • [ 4 ] [Xu, Siyu]Xi An Jiao Tong Univ, Sch Software Engn, Xian, Shaanxi, Peoples R China
  • [ 5 ] [Jin, Congcong]Xi An Jiao Tong Univ, Sch Software Engn, Xian, Shaanxi, Peoples R China
  • [ 6 ] [Guo, Ziyi]Univ Elect Sci & Technol China, Sch Comp Sci & Engn, Chengdu, Sichuan, Peoples R China

Reprint Author's Address:

  • Univ Elect Sci & Technol China, Sch Comp Sci & Engn, Chengdu, Sichuan, Peoples R China.

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Source :

COMPUTERS & ELECTRICAL ENGINEERING

ISSN: 0045-7906

Year: 2018

Volume: 70

Page: 1-11

2 . 1 8 9

JCR@2018

3 . 8 1 8

JCR@2020

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:114

JCR Journal Grade:3

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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