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Author:

Gao, Wenwu (Gao, Wenwu.) | Zhang, Bo (Zhang, Bo.) | Xiang, Feng (Xiang, Feng.)

Indexed by:

EI SCIE Scopus Engineering Village

Abstract:

TiO2 ceramics possess excellent microwave dielectric properties, but defects have a great influence on the dielectric properties of materials. Compared with the TiO2 sintered under air(Resistivity = 109 Ωm, Εr≈ 78.62, 3.2 GHz), in N2 atmosphere, the TiO2 ceramic has a resistivity of 100 Ωm, Εr≈ 105(1 kHz), and the microwave performance degenerates. It proves that the oxygen vacancy defect formed in the anoxic environment is the main reason of the change of electrical properties. Based on the above analysis, TiO2 (N2) ceramics are annealed under air at different temperatures. As the annealing temperature increases to 1200 °C, the resistivity of TiO2 returns to 109 Ωm, Εr≈ 100(around 3 GHz), and the forbidden band width gradually increases to 2.86 eV from 1.42 eV, confirming the annealing treatment method can reduce the concentration of material defects, so that the electrical properties of TiO2 ceramics are better restored. © 2020, Springer Science+Business Media, LLC, part of Springer Nature.

Keyword:

Annealing Atmospheric temperature Defects Dielectric materials Dielectric properties High-k dielectric Nitrogen compounds Optical properties Oxide minerals Sintering Titanium dioxide

Author Community:

  • [ 1 ] [Gao, Wenwu]School of Electronic and Information Engineering & State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an; 710049, China
  • [ 2 ] [Gao, Wenwu]School of Software Engineering, Xi’an Jiaotong University, Xi’an; 710049, China
  • [ 3 ] [Zhang, Bo]School of Electronic and Information Engineering & State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an; 710049, China
  • [ 4 ] [Xiang, Feng]School of Electronic and Information Engineering & State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an; 710049, China

Reprint Author's Address:

  • [Xiang, Feng]School of Electronic and Information Engineering & State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an; 710049, China;;

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Source :

Journal of Materials Science: Materials in Electronics

ISSN: 0957-4522

Year: 2020

Issue: 16

Volume: 31

Page: 13857-13861

2 . 4 7 8

JCR@2020

2 . 4 7 8

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:84

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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