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Author:

Wang, Haoran (Wang, Haoran.) | Liu, Zhiyuan (Liu, Zhiyuan.) | Liu, Jiankun (Liu, Jiankun.) | Geng, Yingsan (Geng, Yingsan.) (Scholars:耿英三) | Wang, Zhenxing (Wang, Zhenxing.) | Wang, Jianhua (Wang, Jianhua.)

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Abstract:

Since metallic vapor could play a vital role in the post-arc breakdown which directly lead to a failure of interruption, it is of importance to research the evolution of metallic vapor in the gap near current zero for better understanding of the post-arc phenomena in a vacuum interrupter. In this work, the technique of planar laser-induced fluorescence(PLIF) is adopted for measuring the 2-D map of copper vapor distribution between a pair of copper contacts. By varying the probing timing of laser sheet, the evolution process of copper vapor near current zero is obtained. It is found that when vacuum arc operates in the anode spot mode, though after current zero, there still exists intense evaporation process from melted anode. The density of evaporated metallic vapor near anode at current zero is about 6× 1018m-3 after calibration. © 2018 IEEE.

Keyword:

Anodes Copper Electric arcs Fluorescence Laser diagnostics Laser optics Laser produced plasmas Plasma diagnostics Vacuum evaporation Vacuum technology

Author Community:

  • [ 1 ] [Wang, Haoran]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China
  • [ 2 ] [Liu, Zhiyuan]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China
  • [ 3 ] [Liu, Jiankun]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China
  • [ 4 ] [Geng, Yingsan]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China
  • [ 5 ] [Wang, Zhenxing]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China
  • [ 6 ] [Wang, Jianhua]Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China

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Source :

ISSN: 1093-2941

Year: 2018

Volume: 1

Page: 313-316

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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