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[期刊]

An improved version of RIGID for discrete element simulation of particle flows with arbitrarily complex geometries

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Author:

Su, Junwei (Su, Junwei.) | Gu, Zhaolin (Gu, Zhaolin.) (Scholars:顾兆林) | Zhang, Mingxu (Zhang, Mingxu.) | Unfold

Indexed by:

SCIE EI Scopus

Abstract:

Traditional discrete element simulations of particle flows in complex geometries rely on the glued particles approximation of geometrical surface. Our recently developed algorithm, RIGID [9], is more robust and accurate than the glued particle method for detecting interactions of spherical particles with arbitrarily shaped walls. However, RIGID is difficult to implement and can be inefficient in identifying particle-vertex or particle-edge contact. To resolve these problems, an improved version of RIGID (RIGID-II) is proposed in this work, which utilizes the basic features of different contact types. By introducing a treatment list to record identification states, the most time consuming step, identification of particle-vertex (edge) contact, is improved significantly. Moreover, such a list can ensure unique identification of particle-vertex or particle-edge contact. Numerical tests show that RIGID-II can predict all contact states accurately. Moreover, it is much more efficient than RIGID and the glued particle method. (C) 2013 Elsevier B.V. All rights reserved.

Keyword:

Complex geometry Discrete element method Dynamic simulation Fluidization Multiphase flows Particle

Author Community:

  • [ 1 ] [Su, Junwei; Gu, Zhaolin; Zhang, Mingxu] Xi An Jiao Tong Univ, Sch Human Settlements & Civil Engn, Xian 710049, Peoples R China
  • [ 2 ] [Xu, Xiao Yun] Univ London Imperial Coll Sci Technol & Med, Dept Chem Engn, London SW7 2AZ, England

Reprint Author's Address:

  • Xi An Jiao Tong Univ, Sch Human Settlements & Civil Engn, Xian 710049, Peoples R China.

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Source :

POWDER TECHNOLOGY

ISSN: 0032-5910

Year: 2014

Volume: 253

Page: 393-405

2 . 3 4 9

JCR@2014

5 . 1 3 4

JCR@2020

ESI Discipline: CHEMISTRY;

ESI HC Threshold:221

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 14

SCOPUS Cited Count: 17

30 Days PV: 9

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