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[期刊]

Heteroepitaxy of single crystal diamond on Ir buffered KTaO3 (001) substrates

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Author:

Wei, Qiang (Wei, Qiang.) | Niu, Gang (Niu, Gang.) | Wang, Ruozheng (Wang, Ruozheng.) | Unfold

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Abstract:

The heteroepitaxy of a single crystal diamond has been carried out in the KTaO3 substrate using Ir as a buffer layer. KTaO3 has a perovskite lattice structure and displays a face-centered cubic structure. Its lattice constant is 3.98 Å, which is only 3% mismatched with the lattice constant of Ir of 3.84 Å, and also, its thermal expansion coefficient is 4.031 × 10−6/K, which is nearly close to that of diamond 3.85 × 10−6/K (at 1223 K), making it to be regarded as an alternate substrate of the heteroepitaxy of a single crystal diamond. The magnetron sputtering technique was used to deposit Ir thin films with a high orientation in the (001) direction on a KTaO3 (001) substrate. Thereafter, bias enhanced nucleation on Ir surface was grown by direct current chemical vapor deposition (CVD) methods. At last, a single crystal diamond with a size of 10 × 10 × 0.78 mm3 has been grown, whose (004) rocking curve FWHM is 183 arc sec, which testifies to the excellent crystalline quality of the heteroepitaxial diamond film. © 2021 Author(s).

Keyword:

Buffer layers Chemical vapor deposition Diamond films Epitaxial growth Lattice constants Perovskite Potassium compounds Single crystals Substrates Tantalum compounds Thermal expansion

Author Community:

  • [ 1 ] [Wei, Qiang]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Niu, Gang]Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Wang, Ruozheng]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Chen, Genqiang]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 5 ] [Lin, Fang]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 6 ] [Zhang, Xiaofan]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 7 ] [Zhang, Zhaoyang]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 8 ] [Wang, Hong-Xing]Key Laboratory of Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an; 710049, China

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Source :

Applied Physics Letters

ISSN: 0003-6951

Year: 2021

Issue: 9

Volume: 119

3 . 7 9 1

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:26

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 9

30 Days PV: 4

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