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Author:

Zhuang, Weibin (Zhuang, Weibin.) | Wu, Yifei (Wu, Yifei.) | Wu, Yi (Wu, Yi.) | Li, Rui (Li, Rui.) | Wu, Ming (Wu, Ming.) | Yang, Fei (Yang, Fei.)

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Abstract:

Press-pack insulated gate bipolar transistor (PP IGBT) is the key component in hybrid direct current circuit breaker (DCCB), due to its fast-breaking speed and large interruption capacity. This paper presents the transient behavior of PP IGBT under rated and fault current interruption conditions. For the purpose of evaluation for thermal behavior of PP IGBT, the power losses under different interruption conditions are analyzed, then the cauer model and FEM model are built based on a 4500V/115A press-pack IGBT for junction temperature estimation. Consequently, analytical investigation in conjunction with cauer thermal network model and FEM simulation demonstrate the thermal behavior of PP IGBT under different DC interruption conditions. © 2021 IEEE.

Keyword:

Electric circuit breakers Finite element method Insulated gate bipolar transistors (IGBT) Presses (machine tools) Thermoanalysis Timing circuits

Author Community:

  • [ 1 ] [Zhuang, Weibin]Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, China
  • [ 2 ] [Wu, Yifei]Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, China
  • [ 3 ] [Wu, Yi]Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, China
  • [ 4 ] [Li, Rui]Power Distribution Institute, China Electric Power Research Institute, Beijing, China
  • [ 5 ] [Wu, Ming]Power Distribution Institute, China Electric Power Research Institute, Beijing, China
  • [ 6 ] [Yang, Fei]Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, China

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Year: 2021

Page: 884-888

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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