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Author:

Ke, Qingqing (Ke, Qingqing.) | Lou, Xiaojie (Lou, Xiaojie.) (Scholars:娄晓杰) | Yang, Haibo (Yang, Haibo.) | Kumar, Amit (Kumar, Amit.) | Zeng, Kaiyang (Zeng, Kaiyang.) | Wang, John (Wang, John.)

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Abstract:

The capacitance dispersion in La and Mg co-substituted BiFeO3 thin film has been studied at different stages of polarization switching. A negative capacitance (NC) behavior is observed in the sample that is fatigued above 10(9) switching cycles. The origin of the NC is investigated through analyzing relaxation processes and charge transport kinetics by admittance spectroscopy. An activation energy of similar to 0.6 eV and a zero field mobility mu(0) = 5.33 +/- 0.02 x 10(-13) m(2)/Vs are thus obtained. A physical mechanism is proposed to explain this behavior. It involves a redistribution of oxygen vacancies, which are trapped at the film/electrode interface during the fatigue process. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733982]

Keyword:

Author Community:

  • [ 1 ] [Ke, Qingqing; Yang, Haibo; Wang, John] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117574, Singapore
  • [ 2 ] [Lou, Xiaojie] Xi An Jiao Tong Univ, Frontier Inst Sci & Technol, Xian 710049, Peoples R China
  • [ 3 ] [Kumar, Amit; Zeng, Kaiyang] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore

Reprint Author's Address:

  • Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117574, Singapore.

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Source :

APPLIED PHYSICS LETTERS

ISSN: 0003-6951

Year: 2012

Issue: 2

Volume: 101

3 . 7 9 4

JCR@2012

3 . 7 9 1

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:196

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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