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Author:

Xiang, Bin (Xiang, Bin.) | Junaid, Muhammad (Junaid, Muhammad.) | Gao, Lei (Gao, Lei.) | Liu, Zhiyuan (Liu, Zhiyuan.) | Geng, Yingsan (Geng, Yingsan.) | Wang, Jianhua (Wang, Jianhua.) | Yanabu, Satoru (Yanabu, Satoru.)

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Abstract:

Short circuit currents show an upward trend in Multi-Terminal High Voltage (MTHV) DC systems. DC resistive type Supercon-ducting Fault Current Limiters (SFCLs) can limit short circuit currents to a much lower level to improve the stability of MTHV DC system. Superconducting tapes used for DC SFCL will quench after a short circuit current attack. Then temperature and voltage of the tapes will increase. The objective of this paper is to obtain the effects of short circuit currents on quench and re-covery properties of the superconducting tapes of DC resistive type SFCLs. YBCO tapes was chosen as investigation samples. This paper concluded that for higher short circuit currents, the temperature and the voltage of the tape was higher. The highest temperature was 379.2 K for YBCO tapes when a short circuit current of 10 kA applied for 50 ms. Recovery time of short circuit current of 10 kA was 240 ms longer than the recovery time of the short circuit current of 500 A. Quenched resistance curves gotten by experiments and analysis were similar, which proved the accu-racy of the analysis. IEEE

Keyword:

Heating system Highest temperature Multi terminals Quenched resistances Recovery properties Recovery time Resistive type sfcls YBCO tape

Author Community:

  • [ 1 ] [Xiang, Bin]The State Key Laboratory of Electrical Insulation and Power Equipment, Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi China 710049 (e-mail: xiangbin0319@163.com)
  • [ 2 ] [Junaid, Muhammad]Electric Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi China (e-mail: junaid@126.com)
  • [ 3 ] [Gao, Lei]State Key Laboratory of Electrical Insulation and Power Equipment, Department of Electrical Engineering, Xi'an Jiaotong University, China (e-mail: anthonylei@yeah.net)
  • [ 4 ] [Liu, Zhiyuan]Electrical Engineering, The State Key Laboratory of Electrical Insulation and Power Equipment, Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, Shannxi China 710049 (e-mail: Liuzy@mail.xjtu.edu.cn)
  • [ 5 ] [Geng, Yingsan]Electrical Engineering, The State Key Laboratory of Electrical Insulation and Power Equipment, Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, Shannxi China 710049 (e-mail: ysgeng@mail.xjtu.edu.cn)
  • [ 6 ] [Wang, Jianhua]the State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, China (e-mail: jhwang@mail.xjtu.edu.cn)
  • [ 7 ] [Yanabu, Satoru]Electrical Engineering, The State Key Laboratory of Electrical Insulation and Power Equipment, Department of Electrical Engineering, Xi'an Jiaotong University, Xi'an, Shannxi China 710049 (e-mail: s.yanabu@mail.xjtu.edu.cn)
  • [ 8 ] [Xiang, Bin]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 9 ] [Junaid, Muhammad]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 10 ] [Gao, Lei]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 11 ] [Liu, Zhiyuan]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 12 ] [Geng, Yingsan]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 13 ] [Wang, Jianhua]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China
  • [ 14 ] [Yanabu, Satoru]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Dept Elect Engn, Xian 710049, Shaanxi, Peoples R China.

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Source :

IEEE Transactions on Applied Superconductivity

ISSN: 1051-8223

Year: 2019

Issue: 2

Volume: 29

1 . 7 0 4

JCR@2020

ESI Discipline: PHYSICS;

ESI HC Threshold:79

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 13

SCOPUS Cited Count: 25

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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