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Author:

Zhao, Dan (Zhao, Dan.) | Liu, Zhangcheng (Liu, Zhangcheng.) | Wang, Juan (Wang, Juan.) | Liang, Yan (Liang, Yan.) | Nauman, Muhammad (Nauman, Muhammad.) | Fu, Jiao (Fu, Jiao.) | Wang, Yan-Feng (Wang, Yan-Feng.) | Fan, Shuwei (Fan, Shuwei.) | Wang, Wei (Wang, Wei.) | Wang, Hong-Xing (Wang, Hong-Xing.)

Indexed by:

SCIE EI Scopus

Abstract:

Fabrication of dual-termination Schottky barrier diode (SBDDT) by using oxygen-/fluorine-terminated diamond (OT-/FT-diamond) has been carried out on P-/P + diamond. X-ray photoelectron spectroscopy (XPS) measurement was used to determine the chemical composition of OT-/FT-diamond surface treated by ultraviolet ozone and C4F8 plasma, respectively. The barrier heights of Au on OT-/FT-diamond were calculated to be 2.0 +/- 0.12 and 2.39 +/- 0.12 eV, respectively. Au film was patterned on the OT-/FT-diamond as the schottky electrode, and Ti/Au film were deposited on the backside of substrate as ohmic electrode, then a SBDDT was achieved completely. SBDDT exhibits better forward and reverse I-V characteristics based on the optimum OT-/FT-diamond (W-O/W-F) area ratio 0.2, which illustrates that the combination of dual surface termination is an efficient way to optimize the performance of diamond SBD.

Keyword:

Barrier height OT-/FT-diamond SBD Surface treatment XPS

Author Community:

  • [ 1 ] [Zhao, Dan; Liu, Zhangcheng; Wang, Juan; Liang, Yan; Nauman, Muhammad; Fu, Jiao; Wang, Yan-Feng; Fan, Shuwei; Wang, Wei; Wang, Hong-Xing] Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 2 ] [Liu, Zhangcheng] Tokushima Univ, Inst Technol & Sci, Tokushima 7708506, Japan
  • [ 3 ] [Zhao, Dan]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 4 ] [Liu, Zhangcheng]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 5 ] [Wang, Juan]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 6 ] [Liang, Yan]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 7 ] [Nauman, Muhammad]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 8 ] [Fu, Jiao]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 9 ] [Wang, Yan-Feng]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 10 ] [Fan, Shuwei]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 11 ] [Wang, Wei]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 12 ] [Wang, Hong-Xing]Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China
  • [ 13 ] [Liu, Zhangcheng]Tokushima Univ, Inst Technol & Sci, Tokushima 7708506, Japan

Reprint Author's Address:

  • Xi An Jiao Tong Univ, Inst Wide Bandgap Semicond, Xian 710049, Shaanxi, Peoples R China.

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Source :

APPLIED SURFACE SCIENCE

ISSN: 0169-4332

Year: 2018

Volume: 457

Page: 411-416

5 . 1 5 5

JCR@2018

6 . 7 0 7

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:182

JCR Journal Grade:2

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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