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Author:

Qian, Zheng-Hua (Qian, Zheng-Hua.) | Jin, Feng (Jin, Feng.) | Lu, Tianjian (Lu, Tianjian.) (Scholars:卢天健) | Kishimoto, Kikuo (Kishimoto, Kikuo.)

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SCIE PubMed EI Scopus

Abstract:

As to an ideally layered structure with a functionally graded piezoelectric substrate (material parameters change continuously along the thickness direction) and a hard dielectric layer, the existence and propagation behavior of transverse surface waves is studied by analytical technique. The dispersion equations for the existence of the transverse surface waves with respect to phase velocity are obtained for electrically open and short circuit conditions, respectively. A detailed investigation of the effect of gradient coefficient on dispersion relation, electromechanical coupling factor and penetration depth is carried out. It is found by numerical examples that adjusting gradient coefficient makes the electromechanical coupling factor of the transverse surface waves achieve quite high values at some appropriate ratio values of the layer thickness to the wavelength, and at the same time, the penetration depth can be reduced to the same order as the wavelength. (C) 2008 Elsevier B. V. All rights reserved.

Keyword:

Dispersion relation Electromechanical coupling factor Layered functionally graded piezoelectric structure Transverse surface waves

Author Community:

  • [ 1 ] [Qian, Zheng-Hua; Jin, Feng; Lu, Tianjian] Xi An Jiao Tong Univ, MOE Key Lab Strength & Vibrat, Dept Engn Mech, Xian 710049, Shaanxi Prov, Peoples R China
  • [ 2 ] [Qian, Zheng-Hua; Kishimoto, Kikuo] Tokyo Inst Technol, Dept Mech Sci & Engn, Meguro Ku, Tokyo 1528552, Japan

Reprint Author's Address:

  • Xi An Jiao Tong Univ, MOE Key Lab Strength & Vibrat, Dept Engn Mech, Xian 710049, Shaanxi Prov, Peoples R China.

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Source :

ULTRASONICS

ISSN: 0041-624X

Year: 2009

Issue: 3

Volume: 49

Page: 293-297

1 . 2 2 3

JCR@2009

2 . 8 9 0

JCR@2020

ESI Discipline: CLINICAL MEDICINE;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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