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Author:

Liu, Liwu (Liu, Liwu.) | Liu, Yanju (Liu, Yanju.) | Luo, Xiaojian (Luo, Xiaojian.) | Li, Bo (Li, Bo.) | Leng, Jinsong (Leng, Jinsong.)

Indexed by:

SCIE EI Scopus

Abstract:

By applying a voltage, electric charge will be induced on the surface of dielectric elastomers. Generally, the charge increases with the level of voltage. When the voltage reaches to a certain value, the charge would not increase any more due to the polarization saturation of dielectric materials. In this paper, a thermodynamic constitutive model, combined both the nonlinear dielectric and hyperelastic behavior as dielectric elastomers undergoing polarization saturation, has been developed. Analytical solutions have been obtained for situations incorporating strain-stiffening effect, electromechanical instability and snap-through instability. The numerical results reveal the marked influence of the extension and polarization saturation limits of elastomer material on its electromechanical instability and the snap-through instability. The developed constitutive model would be helpful in future research of dielectric elastomer based high-performance transducers. (C) 2012 Elsevier Ltd. All rights reserved.

Keyword:

Dielectric elastomer Electromechanical instability Polarization saturation Snap-through instability

Author Community:

  • [ 1 ] [Liu, Liwu; Liu, Yanju; Luo, Xiaojian] Harbin Inst Technol, Dept Astronaut Sci & Mech, Harbin 150001, Peoples R China
  • [ 2 ] [Leng, Jinsong] Harbin Inst Technol, Ctr Composite Mat, Harbin 150080, Peoples R China
  • [ 3 ] [Li, Bo] Xi An Jiao Tong Univ, Sch Mech Engn, Xian 710049, Peoples R China

Reprint Author's Address:

  • Harbin Inst Technol, Dept Astronaut Sci & Mech, POB 301,92 W Dazhi St, Harbin 150001, Peoples R China.

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Source :

MECHANICS OF MATERIALS

ISSN: 0167-6636

Year: 2012

Volume: 55

Page: 60-72

1 . 9 3 6

JCR@2012

3 . 2 6 6

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:325

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 48

SCOPUS Cited Count: 59

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 14

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